Exicon has a total of 72 patents globally, out of which 65 have been granted. Of these 72 patents, more than 76% patents are active. Korea (South) is where Exicon has filed all their patents. Parallelly, Korea (South) seems to be the main focused R&D centre and also is the origin country of Exicon.
Exicon was founded in 2001. Exicon produces modules and semiconductor memory components. Additionally, the business offers test and assembly services.
Do read about some of the most popular patents of Exicon which have been covered by us in this article and also you can find Exicon patents information, the worldwide patent filing activity and its patent filing trend over the years, and many other stats over Exicon patent portfolio. As of February 2023, the market cap of Exicon is $66.5 Million.
How many patents do the Founder of Exicon have?
The Founder Cat Rust, Stefan Rust have 33 patents.
How many patents does Exicon have?
Exicon has a total of 72 patents globally. These patents belong to 71 unique patent families. Out of 72 patents, 55 patents are active.
How Many Patents did Exicon File Every Year?
Are you wondering why there is a drop in patent filing for the last two years? It is because a patent application can take up to 18 months to get published. Certainly, it doesn’t suggest a decrease in the patent filing.
| Year of Patents Filing or Grant | Exicon Applications Filed | Exicon Patents Granted |
| 2022 | – | 4 |
| 2021 | 1 | 4 |
| 2020 | 7 | 12 |
| 2019 | 6 | 3 |
| 2018 | 11 | 7 |
| 2017 | 6 | 5 |
| 2016 | 6 | – |
| 2015 | 1 | – |
| 2011 | – | 5 |
How many Exicon patents are Alive/Dead?
How Many Patents did Exicon File in Different Countries?
Exicon filled all their patents in Korea (South).
Where are Research Centers of Exicon Patents Located?
The Research Center of Exicon Patents is the Korea (South).
List of Exicon Patent
| Exicon Patents | Title |
| KR102467416B1 | Test System Of Testing Different Types Of Duts |
| KR102426476B1 | Test Apparatus Having Function For Test And Timing Compensation Of Semiconductor Device |
| KR102397648B1 | Hybrid Heat Radiator For Test System Of Semiconductor |
| KR102363018B1 | Test System Of Semiconductor Device With Excellent Circulating Perpomance |
| KR102326670B1 | Semiconductor Device Test Apparatus Having Diagnosis Device |
| KR102319127B1 | Sysem For Testing Device-Under-Test Providing Asynchronized Pattern Data |
| KR102319160B1 | Semiconductor Device Test System |
| KR102205616B1 | Dut Test System Combined With System Application Board And Rectangular Shaped Probe Card |
| KR102191678B1 | Soc Test System |
| KR102179063B1 | Soc Test Apparatus Calculating Signal Line Length |
| KR102152090B1 | Test System For Soc And Test Method Thereof |
| KR102141800B1 | Speedy Burn-In Test System Of Semiconductor Memory Device |
| KR102141806B1 | Soc Test Apparatus |
| KR102130315B1 | Cooling System Of Semiconductor Device Test Board |
| KR102130338B1 | Pcie Test Apparatus |
| KR102123637B1 | Multi-Channel Connector |
| KR102102140B1 | Test Board Of Semiconductor Device And Test Method Of The Same |
| KR102106341B1 | Semiconductor Device Test Board For Obtain Integrity Power Supply Voltage |
| KR102106337B1 | High-Speed Clock Synchronization Circuit For Testing Semiconductor Device |
| US10650907B2 | Storage Protocol Matching Device And Method |
| KR102013643B1 | Apparatus And Method For High Speed Burn-In Test |
| KR102033255B1 | Aging Tester Of Semiconductor Memory Module |
| KR102006068B1 | Device For Converting Interface |
| KR101926987B1 | Test System For Testing Semiconductor Memory Device And Method Thereof |
| KR101918961B1 | Apparatus And Method For Repairing Clustered Fault In Irregularly Placed Through Silicon Vias |
| KR101898341B1 | Ssd Test Apparatus |
| KR101911182B1 | Semiconductor Test Device Capable Of Managing The Life Of The Gender And Method Thereof |
| KR101885465B1 | Ssd Bist Apparatus |
| KR101884070B1 | Pcie Test Apparatus |
| KR101879053B1 | Test Equipment In Which Baud Rate Is Set Automatically |
| KR101794134B1 | Test Head For Semiconductor Manufacturing Apparatus |
| KR101794139B1 | Clock Synchronization Circuit System For Testing Semiconductor |
| KR101794136B1 | Test Socket And Test Apparatus For Testing Semiconductor |
| KR101785889B1 | Apparatus And Method For Determining Priority Of Debugging Test Items Associated With Debugging Test Program Of Semiconductor |
| KR101734172B1 | Real-Time Variable Voltage Control Apparatus, Semiconductor Device Test System Using The Same, And Operating Method Thereof |
| KR101047282B1 | Timing Generating Circuit And Timing Generating Method |
| KR101039845B1 | Timing Generating Apparatus And Method Using Field Programmable Gate Array |
| KR101034036B1 | Semiconductor Memory Test Board, Semiconductor Memory Test System Including The Same And Method Of Testing A Semiconductor Memory |
| KR101026467B1 | Clock Signal Control Circuit And Method For Controlling Clock Signal |
| KR101007817B1 | Connector Unit |
| KR100967342B1 | Reconfigurable Serial Signal Generator In Memory Module Tester |
| KR100902376B1 | Connector For Connecting Test Signals For Testing A Semiconductor Device |
| KR200444852Y1 | Magazine For Testing The Solid State Drive |
| KR100885053B1 | Data Capture Circuit For Semiconductor Test Device |
| KR100885051B1 | Semiconductor Memory Test Device And Mehtod Of Testing A Semiconductor Memory Device |
| KR300518572S | Member On Which The Solid State Drive Is Mounted |
| KR200443263Y1 | Apparatus Of Loading Solid State Drive For Testing The Solid State Drive |
| KR300516836S | The Member On Which The Solid State Drive Mounting Device Is Mounted |
| KR100875679B1 | Connector For Connecting Test Signals For A Semiconductor Device And Apparatus For Testing A Semiconductor Device Having The Same |
| KR100864633B1 | Semiconductor Memory Test Apparatus And Method Of Testing A Semiconductor Memory |
| KR300508986S | Sliding Member Of Solid State Drive Mounting Device |
| KR300508987S | Housing Member Of Solid State Drive Mounting Device |
| KR100814381B1 | Apparatus For Testing Semiconductor Package Device |
| KR100793261B1 | Connector Having Multi-Driving Mode |
| KR100783647B1 | A Method For Skew Compensation And An Apparatus Usingthe Method |
| KR100719386B1 | Dual Transmission Line Topology Capable Of Connectingselected Functional Block To Semiconductor Device, Andtester Of Semiconductor Device Using The Same |
| KR100560616B1 | A Divergence Method For High Speed Test In Auto Test Equipment Of Memory |
| KR100433739B1 | High-Fix Replacement Method And Device Installed In Semiconductor Tester |
| KR100430882B1 | Testing Device For The Laser Diode |
| KR100401932B1 | Test Method Of Semiconductor Device Through Test Handler |
| KR100401930B1 | Quality Test Method Of Tft Cell Array For Flat Board Display Using A Magnetic Field Measured By Non-Contact Mode |
| KR100401931B1 | Non-Contact Quality Test Method Of Tft Cell Array For Flat Board Display Using A Working Principle Of Capacitor |
| KR100367307B1 | Socket Module For Testing For Memory Component Mounting Contacts |
| KR100366886B1 | Method For Burn-In In Apc Mode Using Calibratedinternal Monitor Photo Diode |
| KR200267138Y1 | Test Socket Module For Memory Component Real Contact |
| KR1020220102424A | Opening And Closing Apparatus For Chamber |
| KR1020200014991A | Storage Protocol Matching Device And Method Thereof |
| KR1020200012096A | Power Supply System And Power Supply Method Thereof |
| KR1020100114147A | Redundancy Analysis Apparatus And Method Of Analyzing Redundancy |
| KR1020100109287A | Connector For Test Device |
| KR1020090003755A | Ejector For Ejecting A Test Board |
| KR1020020083967A | Measurement Method Of Cell Voltage On Lcd Circuit Using Electric Field Sensor Array |