Exicon Patents – Key Insights and Stats

Exicon has a total of 72 patents globally, out of which 65 have been granted. Of these 72 patents, more than 76% patents are active. Korea (South) is where Exicon has filed all their patents. Parallelly, Korea (South) seems to be the main focused R&D centre and also is the origin country of Exicon.

Exicon was founded in 2001. Exicon produces modules and semiconductor memory components. Additionally, the business offers test and assembly services.

Do read about some of the most popular patents of Exicon which have been covered by us in this article and also you can find Exicon patents information, the worldwide patent filing activity and its patent filing trend over the years, and many other stats over Exicon patent portfolio. As of February 2023, the market cap of Exicon is $66.5 Million.

How many patents do the Founder of Exicon have?

The Founder Cat Rust, Stefan Rust have 33 patents.

How many patents does Exicon have?

Exicon has a total of 72 patents globally. These patents belong to 71 unique patent families. Out of 72 patents, 55 patents are active.

How Many Patents did Exicon File Every Year?

Exicon Patent Filling Trend

Are you wondering why there is a drop in patent filing for the last two years? It is because a patent application can take up to 18 months to get published. Certainly, it doesn’t suggest a decrease in the patent filing.

Year of Patents Filing or GrantExicon Applications FiledExicon Patents Granted

How many Exicon patents are Alive/Dead?

Exicon Patent Portfolio

How Many Patents did Exicon File in Different Countries?

Exicon filled all their patents in Korea (South).

Where are Research Centers of Exicon Patents Located?

The Research Center of Exicon Patents is the Korea (South).

List of Exicon Patent

Exicon PatentsTitle
KR102467416B1Test System Of Testing Different Types Of Duts
KR102426476B1Test Apparatus Having Function For Test And Timing Compensation Of Semiconductor Device
KR102397648B1Hybrid Heat Radiator For Test System Of Semiconductor
KR102363018B1Test System Of Semiconductor Device With Excellent Circulating Perpomance
KR102326670B1Semiconductor Device Test Apparatus Having Diagnosis Device
KR102319127B1Sysem For Testing Device-Under-Test Providing Asynchronized Pattern Data
KR102319160B1Semiconductor Device Test System
KR102205616B1Dut Test System Combined With System Application Board And Rectangular Shaped Probe Card
KR102191678B1Soc Test System
KR102179063B1Soc Test Apparatus Calculating Signal Line Length
KR102152090B1Test System For Soc And Test Method Thereof
KR102141800B1Speedy Burn-In Test System Of Semiconductor Memory Device
KR102141806B1Soc Test Apparatus
KR102130315B1Cooling System Of Semiconductor Device Test Board
KR102130338B1Pcie Test Apparatus
KR102123637B1Multi-Channel Connector
KR102102140B1Test Board Of Semiconductor Device And Test Method Of The Same
KR102106341B1Semiconductor Device Test Board For Obtain Integrity Power Supply Voltage
KR102106337B1High-Speed Clock Synchronization Circuit For Testing Semiconductor Device
US10650907B2Storage Protocol Matching Device And Method
KR102013643B1Apparatus And Method For High Speed Burn-In Test
KR102033255B1Aging Tester Of Semiconductor Memory Module
KR102006068B1Device For Converting Interface
KR101926987B1Test System For Testing Semiconductor Memory Device And Method Thereof
KR101918961B1Apparatus And Method For Repairing Clustered Fault In Irregularly Placed Through Silicon Vias
KR101898341B1Ssd Test Apparatus
KR101911182B1Semiconductor Test Device Capable Of Managing The Life Of The Gender And Method Thereof
KR101885465B1Ssd Bist Apparatus
KR101884070B1Pcie Test Apparatus
KR101879053B1Test Equipment In Which Baud Rate Is Set Automatically
KR101794134B1Test Head For Semiconductor Manufacturing Apparatus
KR101794139B1Clock Synchronization Circuit System For Testing Semiconductor
KR101794136B1Test Socket And Test Apparatus For Testing Semiconductor
KR101785889B1Apparatus And Method For Determining Priority Of Debugging Test Items Associated With Debugging Test Program Of Semiconductor
KR101734172B1Real-Time Variable Voltage Control Apparatus, Semiconductor Device Test System Using The Same, And Operating Method Thereof
KR101047282B1Timing Generating Circuit And Timing Generating Method
KR101039845B1Timing Generating Apparatus And Method Using Field Programmable Gate Array
KR101034036B1Semiconductor Memory Test Board, Semiconductor Memory Test System Including The Same And Method Of Testing A Semiconductor Memory
KR101026467B1Clock Signal Control Circuit And Method For Controlling Clock Signal
KR101007817B1Connector Unit
KR100967342B1Reconfigurable Serial Signal Generator In Memory Module Tester
KR100902376B1Connector For Connecting Test Signals For Testing A Semiconductor Device
KR200444852Y1Magazine For Testing The Solid State Drive
KR100885053B1Data Capture Circuit For Semiconductor Test Device
KR100885051B1Semiconductor Memory Test Device And Mehtod Of Testing A Semiconductor Memory Device
KR300518572SMember On Which The Solid State Drive Is Mounted
KR200443263Y1Apparatus Of Loading Solid State Drive For Testing The Solid State Drive
KR300516836SThe Member On Which The Solid State Drive Mounting Device Is Mounted
KR100875679B1Connector For Connecting Test Signals For A Semiconductor Device And Apparatus For Testing A Semiconductor Device Having The Same
KR100864633B1Semiconductor Memory Test Apparatus And Method Of Testing A Semiconductor Memory
KR300508986SSliding Member Of Solid State Drive Mounting Device
KR300508987SHousing Member Of Solid State Drive Mounting Device
KR100814381B1Apparatus For Testing Semiconductor Package Device
KR100793261B1Connector Having Multi-Driving Mode
KR100783647B1A Method For Skew Compensation And An Apparatus Usingthe Method
KR100719386B1Dual Transmission Line Topology Capable Of Connectingselected Functional Block To Semiconductor Device, Andtester Of Semiconductor Device Using The Same
KR100560616B1A Divergence Method For High Speed Test In Auto Test Equipment Of Memory
KR100433739B1High-Fix Replacement Method And Device Installed In Semiconductor Tester
KR100430882B1Testing Device For The Laser Diode
KR100401932B1Test Method Of Semiconductor Device Through Test Handler
KR100401930B1Quality Test Method Of Tft Cell Array For Flat Board Display Using A Magnetic Field Measured By Non-Contact Mode
KR100401931B1Non-Contact Quality Test Method Of Tft Cell Array For Flat Board Display Using A Working Principle Of Capacitor
KR100367307B1Socket Module For Testing For Memory Component Mounting Contacts
KR100366886B1Method For Burn-In In Apc Mode Using Calibratedinternal Monitor Photo Diode
KR200267138Y1Test Socket Module For Memory Component Real Contact
KR1020220102424AOpening And Closing Apparatus For Chamber
KR1020200014991AStorage Protocol Matching Device And Method Thereof
KR1020200012096APower Supply System And Power Supply Method Thereof
KR1020100114147ARedundancy Analysis Apparatus And Method Of Analyzing Redundancy
KR1020100109287AConnector For Test Device
KR1020090003755AEjector For Ejecting A Test Board
KR1020020083967AMeasurement Method Of Cell Voltage On Lcd Circuit Using Electric Field Sensor Array

What are Exicon key innovation segments?

What Technologies are Covered by Exicon?

The chart below distributes patents filed by Exicon in different countries on the basis of the technology protected in patents. It also represents the markets where Exicon thinks it’s important to protect particular technology inventions.

R&D Focus: How has Exicon search focus changed over the years?


Interested in knowing about the areas of innovation that are being protected by Exicon?

Table of Content

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Our comprehensive report provides an in-depth look into the patent portfolio. The report includes a breakdown of the patent portfolio across various technologies, listing the patent along with brief summaries of each patent's technology.