Labsphere has a total of 27 patents globally, out of which 12 have been granted. Of these 27 patents, more than 33% patents are active. United States Of America is where Labsphere has filed the maximum number of patents, followed by Australia and Korea(South). Parallelly, United States Of America seems to be the main focused R&D centre.
Labsphere was founded in the year 1979. The Company deals in light testing and measurement, and optical coatings.
Do read about some of the most popular patents of Labsphere which have been covered by us in this article and also you can find Labsphere patents information, the worldwide patent filing activity and its patent filing trend over the years, and many other stats over Labsphere patent portfolio.
How many patents does Labsphere have?
Labsphere has a total of 27 patents globally. These patents belong to 13 unique patent families. Out of 27 patents, 9 patents are active.
How Many Patents did Labsphere File Every Year?
Are you wondering why there is a drop in patent filing for the last two years? It is because a patent application can take up to 18 months to get published. Certainly, it doesn’t suggest a decrease in the patent filing.
Year of Patents Filing or Grant | Labsphere Applications Filed | Labsphere Patents Granted |
2022 | 1 | 2 |
2021 | 7 | – |
2020 | 1 | – |
2017 | – | 3 |
2016 | – | 3 |
2014 | – | 1 |
2012 | 3 | – |
2011 | 7 | – |
How many Labsphere patents are Alive/Dead?
How Many Patents did Labsphere File in Different Countries?
Where are Research Centres of Labsphere Patents Located?
10 Best Labsphere Patents
US20080204578A1 is the most popular patent in the Labsphere portfolio. It has received 30 citations so far from company like Verifood.
Below is the list of 10 most cited patents of Labsphere:
Publication Number | Citation Count |
US20080204578A1 | 30 |
US6734959B2 | 30 |
US6597195B1 | 27 |
WO2013082512A1 | 13 |
US20140340680A1 | 9 |
US6654861B2 | 2 |
WO2021247795A1 | 1 |
US9239259B2 | 1 |
WO2013054379A1 | 1 |
US20220341567A1 | 0 |
List of Labsphere Patents
Labsphere Patents | Title |
US20220341567A1 | Systems for Controlling a Reflector Array |
US11272593B2 | System and methods for providing a uniform and tunable hyper-spectral source |
US11228699B2 | Systems and methods for determining a minimum resolvable distance of an imaging system |
US20210383573A1 | Calibration network systems and methods of using the same |
US20210382264A1 | Protected Reflector Array for a Calibration System |
US20210381891A1 | Field spectral radiometers including calibration assemblies |
WO2021247795A1 | Calibration network systems and methods of using the same |
WO2021247625A1 | Field spectral radiometers including calibration assemblies |
WO2021211324A1 | Systems and methods for determining a minimum resolvable distance of an imaging system |
KR101781249B1 | Optical measurement system, optical measurement method, and mirror plate for optical measurement system |
EP2748569B1 | Optical measurement system, optical measurement method, and mirror plate for optical measurement system |
DE602011038828T2 | optical MEASUREMENT SYSTEM, OPTICAL MEASUREMENT METHOD AND MIRROR PLATE FOR AN OPTICAL MEASUREMENT SYSTEM |
TWI560430B | Optical measurement system, optical measurement method, and mirror plate for optical measurement system |
CN103477196B | Optical measuring system and optical measuring method |
US9239259B2 | Optical measurement system, optical measurement method, and mirror plate for optical measurement system |
US20140340680A1 | Apparatus and method for mobile device camera testing |
JP5501540B2 | Optical measuring system, optical measuring method and mirror plate for optical measuring system |
WO2013082512A1 | Apparatus and method for mobile device camera testing |
WO2013054379A1 | Optical measurement system, optical measurement method, and mirror plate for optical measurement system |
US20080204578A1 | Image sensor dark correction method, apparatus, and system |
WO2008103886A1 | Image sensor dark correction method, apparatus and system |
US6734959B2 | Prober for testing light-emitting devices on a wafer |
US6654861B2 | Method to manage multiple communication queues in an 8-bit microcontroller |
US6597195B1 | Method of and cassette structure for burn-in and life testing of multiple LEDs and the like |
WO2002010697A3 | Method and apparatus for measuring the optical characteristics of light sources |
AU2001270935A1 | Method and apparatus for measuring the optical characteristics of light sources |
AU2001070935A1 | Method and apparatus for measuring the optical characteristics of light sources |